Measuring the Characteristic Length Scale of Medium Range Order in Amorphous Silicon Using Variable Resolution Fluctuation Electron Microscopy
نویسندگان
چکیده
منابع مشابه
Fluctuation microscopy: a probe of medium range order
Fluctuation microscopy is a hybrid diffraction-imaging technique that detects medium range order in amorphous materials by examining spatial fluctuations in coherent scattering. These fluctuations appear as speckle in images and diffraction patterns. The volume of material contributing to the speckle is determined by the point-spread function (the resolution) of the imaging optics and the sampl...
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Si and a-Ge, both the structure factor and V(k) consistently show two broad peaks at k1 = 3.2 nm -1 and k2 = 5.5 nm . The paracrystalline model (pc-Si) of a-Si consisting of nano-sized, strained crystalline grains embedded in a continuous random network (CRN) matrix is consistent with FEM data. The magnitude of V(k) varies with the paracrystallite size and volume fraction, but the first peak is...
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Ideal models of complex materials must satisfy all available information about the system. Generally, this information consists of experimental data, information implicit to sophisticated interatomic interactions and potentially other a priori information. By jointly imposing first-principles or tightbinding information in conjunction with experimental data, we have developed a method: experime...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2005
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927605506779